Peizheng Yan

Associate Professor

School of Instrument Science and Opto-electronics Engineering. HFUT

Tel: 15956925542
Mail:  pzyan@hfut.edu.cn

• 09, 2006 - 07, 2010: Bachelor's degree, Dept. of Precision Mechanical Instruments, University of Science and Technology of China, PR China.

• 09, 2010 - 06, 2015: Doctor’s degree, Dept. of Precision Mechanical Instruments, University of Science and Technology of China, PR China.

• 06, 2015 - Today: Lecturer and Associate Professor, School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, PR China.

Teaching

Applied Optical Design, Opto-mechanical course design

Research

Development and application of advanced optical techniques for solving engineering problems. The research focuses on optical metrology, digital speckle pattern interferometry, shearography, experimental strain/stress analysis, nondestructive testing and material evaluation, vibration measurement and analysis.

Selected Papers/Patentsand Honors

[1]Xiangwei L ,Yonghong W ,Liang Z , Biao W , Peizheng Y*. High-precision dynamic measurement of roll angle based on digital holography[J].Optics and Lasers in Engineering,2023,169:107711.

[2]Peizheng Y ,Xiangwei L ,Jingtao D , Yonghong W* , Biao W , Jianquan L , Fangyuan S. Robust dynamic phase-shifting common-path shearography using LCPG and pixelated micropolarizer array[J].Optics and Lasers in Engineering,2022,153:106997.

[3]Peizheng Y , Yonghong W* , Fangyuan S , Yu L , Lu L , Qihan Z. Shearography for non-destructive testing of specular reflecting objects using scattered light illumination[J].Optics and Laser Technology,2019,112:452-457. 

[4]Yonghong W ,Xiao Z , Qihan Z , Yanfeng Y , Peizheng Y* , Biao W. New multiplexed system for synchronous measurement of out-of-plane deformation and two orthogonal slopes[J].Chinese Physics B,2022,31(3):034202.

[5]Peizheng Y , Fangyuan S ,Xizuo D , Qihan Z , Yonghong W* , Yu L. Spatial phase-shift digital shearography for simultaneous measurements in three shearing directions based on adjustable aperture multiplexing[J].Optical Engineering,2019,58(05):054105.