Lei Yang

Doctor/Associate Professor/ Director of Anhui Institute of Metrology and Testing

Department of Optoelectronic Information Science and Engineering

Tel:
Mail:  yanglei@hfut,edu.cn

• 07, 2004-Present:  Associate Professor and Lecturer, School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, PR China

• 2015-Present:  Director and Council member of Anhui Institute of Metrology and Testing, PR China

• 10. 2019-10. 2020: Visiting scholar, School of Engineering and Computer Science, Oakland University, USA

Teaching

Signals and Systems

Embedded Image Processing

Design of Instrument System 

Research

Research and engineering applications of spectral technology for composition analysis of objects, surface morphology detection and defect detection based on machine vision and spectroscopy, and research and development of related instruments and equipment. The research focuses on laser-induced breakdown spectroscopy (LIBS), infrared spectroscopy, and Raman spectroscopy. 

Selected Papers/Patentsand Honors

1. Lei Yang*, Yanhui Zhang, Yinchuan Li, et al.. Enhancement of LIBS plasma and efficient collection of emitted light by open smooth triangular cavity. Journal of Analytical Atomic Spectrometry, 2023, 38(6), 1182-1191 (Cover Article)

2. Lei Yang*, Yong Xiang, Yinchuan Li, et al.. Identification and Classification of Recyclable Waste Using Laser-Induced Breakdown Spectroscopy Technology. AIP advances, 2023, 13(7):075024 (Featured Article, reported by EurekAlert!、Physics Today、Electro Optics、Spectroscopy Magazine、Hard Shell Technology - Future Light Cone ) 

3. Lei Yang*, Yanhui Zhang, Zi Zhang, et al.. Effects of sample surface morphology on laser-induced breakdown spectroscopy. Journal of Analytical Atomic Spectrometry, 2022, 37(8):1642-1651. (Cover Article)

4. Lei Yang*, Yanhui Zhang, Jiaming Liu, et al.. Spectral preprocessing to improve accuracy of quantitative detection of elemental Cr in austenitic stainless steel by laser-induced breakdown spectroscopy, Review of Scientific Instruments, 2022, 93(3):033002

5. Lei Yang*, Liqiao Lei. Surface roughness extraction based on Markov Random Field Model in wavelet feature domain. Optical Engineering, December 2014, 53(12):122414