Haojie Xia

Professor, Deans of Faculties

School of Instrument Science and Opto-electronics Engineering

Tel: 0551-62901511
Mail:  hjxia@hfut.edu.cn

• 09, 2018 - : Professor, Head of Center for Precision Engineering, Hefei University of Technology

• 09,2006-06,2018, Lecturer, Associate Professor, Professor, School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology

Teaching

Fundamentals of Precision Engineering，Optical Measurement Techniques: Fundamentals and Applications

Research

Xia's research interests are precise dimensional measurement including laser interferometry application, surface topography and super-resolution microscopy technique. With machine learning and sensor fusion, Xia's research is focus on surface topography measurement for optical lens, small hole to quality control in advanced manufacturing, and is developing the label-free stimulated Raman scattering microscopy and optical coherence tomography for biological inspection and semiconductor manufacturing with collaboration with advanced sensor and interment manufacturer.

Selected Papers/Patentsand Honors

1.Xin Yu, Songtao Chang, Weishi Li, Haojie Xia*, A Low-Cost FPGA-Based Coarse-Fine Counting Time-to-Digital Converter With External High-Precision Reference Clock, IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 72, 2023;

2.Rencheng Song, Han Wang, Haojie Xia∗, Juan Cheng, Chang Li, Xun Chen, Uncertainty Quantification for Deep Learning-Based Remote Photoplethysmography, IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 72, 2023;

3.Feifan Xu, Songtao Chang, Yulu Zhao, Weishi Li, Haojie Xia∗, High-precision moire alignment method using centrosymmetric grating for 3D interlayer interconnect, Optics and Lasers in Engineering 171 (2023) 107815;

4.Yulu Zhao, Songtao Chang, Weishi Li, Jin Zhang, Kirill Poletkin, Haojie Xia∗, Dispersion lens for chromatic confocal spectral interferometry, Optics and Lasers in Engineering 173 (2024) 107917;.

5.Pei Yang, Ziyi Yang, Jin Zhang and Haojie Xia*, A calibration method for line-structured light using mirror-based virtual binocular vision system, Measurement Science and Technology, 34 (2023) 105205;